🔒 Note: The source code for this project is currently private due to pending publication. Hiring managers may request access by providing their GitHub email.
This directory contains the comprehensive performance analysis of six machine learning architectures evaluated for the semiconductor fault detection pipelineon SECOM data set.
The primary objective was to maximize Safety (Recall) to prevent critical faults from escaping, while maintaining operational Efficiency (Precision).
Click the link above to view the detailed 2-page datasheet including ROC Curves, PR Curves, and Feature Importance plots for all models.
Analysis performed by Dr. Sunil Kumar Samji